MicroFinish Topographer (MFT)

Easy, direct measurement of large, and very large optics

Rapid, non-contact roughness measurement of small optics

Inexpensive, simple, flexible measurement platform

Mounts directly on a diamond turning system

MicroFinish Topographer

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Cost-Effective Surface Roughness Measurement
The MicroFinish Topographer is a simple, low cost system for measuring surface roughness on small, large and very large optics. This precision phase measuring interferometer, complete with industry leading Reveal™ data analysis software, offers a combination of simplicity, analysis power and ease of use that is simply not available in a stylus profiler or workstation optical profiler.

MicroFinish Topographer

Simple Large Optic Measurement
In the standard, down-looking configuration, the MFT lets you directly measure any location on a large optic’s surface, rather than using messy replication methods that can lead to contamination. Because it is directly coupled to the optic, no vibration isolation is required. Three nylon support balls gently contact the surface, and simple tip/tilt and focus controls help you quickly obtain high contrast fringes. Once the controls are set, you can move the MFT around the optic surface without readjusting, for easy, rapid and comprehensive roughness measurement.

Rapid Small Optics Inspection
The MFT’s optional look-up configuration lets you place small optics (up to 150 mm diameter) directly on the stage. Set the tip/tilt and focus once for a particular type of optic, then rapidly measure similar optics for incoming inspection or outgoing quality control without readjustment.

Immediate Finish Feedback
The MFT can be mounted on a diamond turning machine for fast surface roughness feedback without vibration isolation. By eliminating the need for re-fixturing, the MFT greatly improves productivity while also protecting critical optics from handling damage.

The MicroFinish Topographer is a complete system, with computer, software and fixturing for accurate, flexible, inexpensive surface roughness measurement.